EFFICIENT TOPOGRAPHIC CORRECTIONS FOR RESISTIVITY DATA
来源期刊:中国有色金属学报(英文版)1992年第3期
论文作者:He Jishan
文章页码:1 - 10
Key words:topographic correction; angular domain; cubic spline
Abstract: The development of topography effect correction on resistivity data was summed up.Mainly the correction technique based on angular domain superposition and ratio method was discussed to solve point source and 2-D topography problem. The nature of ratio topography correction was proved and the results were spread to point source. Based on systematicahy studying anomalies of angular domains with different angles,a fast method of topography correction was presented which can be run on personal computer and get resonable accuracy.