Lifetime prediction for tantalum capacitors with multiple degradation measures and particle swarm optimization based grey model

来源期刊:中南大学学报(英文版)2012年第5期

论文作者:黄姣英 高成 崔嵬 梅亮

文章页码:1302 - 1310

Key words:accelerated degradation test; capacitor; multiple degradation measure; particle swarm optimization; grey model

Abstract: A lifetime prediction method for high-reliability tantalum (Ta) capacitors was proposed, based on multiple degradation measures and grey model (GM). For analyzing performance degradation data, a two-parameter model based on GM was developed. In order to improve the prediction accuracy of the two-parameter model, parameter selection based on particle swarm optimization (PSO) was used. Then, the new PSO-GM(1, 2, w) optimization model was constructed, which was validated experimentally by conducting an accelerated testing on the Ta capacitors. The experiments were conducted at three different stress levels of 85, 120, and 145 ℃. The results of two experiments were used in estimating the parameters. And the reliability of the Ta capacitors was estimated at the same stress conditions of the third experiment. The results indicate that the proposed method is valid and accurate.

有色金属在线官网  |   会议  |   在线投稿  |   购买纸书  |   科技图书馆

中南大学出版社 技术支持 版权声明   电话:0731-88830515 88830516   传真:0731-88710482   Email:administrator@cnnmol.com

互联网出版许可证:(署)网出证(京)字第342号   京ICP备17050991号-6      京公网安备11010802042557号