细晶Al-5356合金在低应变速率下基于高分辨率应变测量的“异常瞬时蠕变”

来源期刊:中国有色金属学报(英文版)2013年第5期

论文作者:申俊杰 Kenichi IKEDA Satoshi HATA Hideharu NAKASHIMA

文章页码:1209 - 1214

关键词:Al-5356合金;瞬时蠕变;相变;低应变速率

Key words:Al-5356 alloy; transient creep; phase change; low strain rate

摘    要:极低应变速率下(<10-10 s-1)的瞬时蠕变仍然未知。由于应变分辨率低(~10-6),传统的单轴拉伸/压缩等蠕变测试技术并不能满足此蠕变区的测试要求。采用具有高应变分辨率的螺旋弹簧蠕变试验法,研究Al-5356合金在温度范围为0.4Tm~0.8Tm (Tm为熔点的绝对温度)、应变速率小于10-10 s-1的瞬时蠕变行为。采用透射电子显微镜研究蠕变微观组织以揭示极低应变速率下的瞬时蠕变机制。实验结果首次显示了一些异常蠕变行为: “高温强化”(T>Tp,Tp为发生相变的温度, Tp=0.58Tm)或“中温弱化”(0.4Tm<T£Tp)和“双正常型蠕变”(蠕变曲线包含两次加工硬化阶段(T=Tp))。试样经中温(0.58Tm)蠕变后(1×10-4),微观组织中发现有大量等间隔割阶的塞积位错和从晶界发射的弧形位错。当温度高于523 K时,b-Al3Mg2相溶解引起固溶Mg量增加,因此,异常蠕变行为可能归因于蠕变过程中相转变引起的固溶强化的差异。

Abstract: Transient creep at very low strain rates (less than 10-10 s-1) is still unclear. The traditional uniaxial creep testing is less useful due to unsatisfied resolution strain (~10-6). To study transient creep behavior at such low strain rates, a high-resolution strain measurement using the helicoid spring specimen technique was employed in a fine-grained Al-5356 alloy at temperatures ranging from 0.47Tm to 0.74Tm (Tm: melting point). To clarify transient creep mechanism at such low strain rates, transmission electron microscopy (TEM) was used in microstructure observation of crept specimens. The abnormal transient creep, high temperature strengthening at T>Tp (Tp: the phase transformation temperature, 0.58Tm) or intermediate temperature softening at 0.4Tm<T£Tp and double-normal type (creep curves including double work-hardening stages) at T=Tp, were firstly observed. The substructure observation in a crept specimen at T=0.58Tm and e=1×10-4 shows pile-up dislocations including many small jogs with equal interval, and dislocations emitted from grain boundaries. The b-Al3Mg2 phase dissolves under the condition of testing temperatures higher than 523 K, which causes solid-solution quantity of Mg atoms to increase. Therefore, the “abnormal transient creep” may be related to the difference of solid solution strengthening caused by phase change during the creep tests.

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