Microstructure Characterization of Sol-gel Prepared MoO3-TiO2 Thin Films for Oxygen Gas Sensors
来源期刊：材料科学与工程学报2000年增刊第2期
论文作者：Yongxiang Li
关键词：Sol-gel process; MoO3; TiO2; thin film; oxygen sensing;
摘 要：Binary metal oxide MoO3-TiO2 films have been prepared using the sol-gel technique. The thin films were annealed at several temperatures including 400℃,450℃,500℃,550℃ and 600℃ for lhour. The morphology, crystalline structure and chemical composition of the films have been analysed using SEM,XRD,RBS and XPS techniques. The SEM analysis showed that the films annealed at 450℃ are mainly smooth and uniform with 20-100nm-sized grains and with few particles as large as a micrometre or more. The XRD analysis revealed that the films annealed at 400℃ were a mixture of orthorhombic and hexagonal MoO3phases. The films annealed at 450℃ increased in hexagonal phase. The preferential orientation growth along(100) plane of the hexagonal phase and (010) plane of the orthorhombic phase has been found in both samples. RBS and XPS analysis showed that the films were stoichiometric. When the annealing temperature is increased to more than 500℃, the concentration ratio of MoO3 to TiO2 decreased due to the evaporation of MoO3. For the study of the electrical and gas sensing properties, films were deposited on sapphire substrates with interdigital electrodes on the front-side and a Pt heater on the backside. The O2 gas sensing properties of MoO3-TiO2 thin films are discussed.
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摘要:Binary metal oxide MoO3-TiO2 films have been prepared using the sol-gel technique. The thin films were annealed at several temperatures including 400℃,450℃,500℃,550℃ and 600℃ for lhour. The morphology, crystalline structure and chemical composition of the films have been analysed using SEM,XRD,RBS and XPS techniques. The SEM analysis showed that the films annealed at 450℃ are mainly smooth and uniform with 20-100nm-sized grains and with few particles as large as a micrometre or more. The XRD analysis revealed that the films annealed at 400℃ were a mixture of orthorhombic and hexagonal MoO3phases. The films annealed at 450℃ increased in hexagonal phase. The preferential orientation growth along(100) plane of the hexagonal phase and (010) plane of the orthorhombic phase has been found in both samples. RBS and XPS analysis showed that the films were stoichiometric. When the annealing temperature is increased to more than 500℃, the concentration ratio of MoO3 to TiO2 decreased due to the evaporation of MoO3. For the study of the electrical and gas sensing properties, films were deposited on sapphire substrates with interdigital electrodes on the front-side and a Pt heater on the backside. The O2 gas sensing properties of MoO3-TiO2 thin films are discussed.
关键词:Sol-gel process; MoO3; TiO2; thin film; oxygen sensing;
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