钢中细小夹杂物的研究方法探讨

来源期刊：冶金分析2010年第10期

论文作者：齐江华 吴杰 索进平 薛正良 付兵 田青

文章页码：1 - 5

关键词：扫描电镜； 透射电镜； 离子减薄； 细小夹杂物； 物相

Key words：Scanning Electron Microscope(SEM)； Transmission Electron Microscopy (TEM)； ion thinning； fine inclusion； phase

摘    要：以氧化物冶金领域中研究最为广泛的钛脱氧产物为例,通过扫描电镜(SEM)对金相试样和电解夹杂物的观察,大样电解萃取夹杂物后X射线衍射(XRD)分析,金属薄膜法制样的透射电镜(TEM)分析,采用离子减薄技术后的电子背散射衍射(EBSD)分析和通过采用RTO法制样的透射电镜分析,对细小夹杂物的研究方法尤其是内部结构和物相组成的研究进行了探讨。实践表明,小样电解是提取钢中细小夹杂物的最好方法,而大样电解可能对夹杂物造成损害。微米级夹杂物采用金属薄膜法制样比较困难,但采用离子减薄后,在SEM下可清晰的观察夹杂物的内部结构并采用EBSD分析其相组成。

Abstract: The Ti-deoxidized products which was widely studied in the field of oxides metallurgy was taken as an example.The research method of superfine inclusion especially the method of studying inner structure and phase composition was discussed by means of observation of metallograhic specimen and inclusion from electrolyzing under SEM,XRD analysis of inclusions extracted from large sample electrolyzation,TEM analysis with metallic film method,EBSD analysis with ion thinning technology,TEM analysis with sample preparation by using RTO method.Through these practices,it showed that small sample electrolyzation is the best method to extract fine inclusion,while the fine inclusion would be damaged in the course of large electrolyzation.It is difficult to use metallic film method to prepare micron-sized inclusion,but with the technique of ion beam thinning,the inner structure of these inclusions can be observed clearly and the phase can be defined by EBSD under SEM.