简介概要

Mid-Temperature Synthesis of CeO2-TiO2 Complex Compound and Its XRD Structure Study

来源期刊:JOURNAL OF RARE EARTHS2003年第2期

论文作者:陈林深 吕光烈 胡秀荣

Key words:Semiconductor materials; sol-gel process; CeO2-TiO2 complex compound; XRD Rietveld analysis; rare earths;

Abstract: The CeTi2O6, which is formed above 1300 ℃ by ceramic method, was obtained at 700 ℃ using sol-gel synthesis method. XRD analysis shows that there is 8% deficient of Ce in the structure. The chemical formula is Ce0.92Ti2O5.84, which has a monoclinic structure with space group of C 2/m. Its cell parameters are a=0.9811(8) nm, b=0.3726(3) nm, c=0.6831(6) nm, and β=118.84°. After being treated at 1300 ℃ for 3 h, the system keeps stable but the deficient disappears, while the chemical formula change to the normal CeTi2O6, and the cell parameters are a=0.9813(3) nm, b=0.3752(4) nm, c=0.6883(5) nm, β=119.05°. The key to synthesis the precursors of CeTi2O6 is that Ti4+ and Ce3+ ions must reach the atomistic distributing state and prevent the oxidation of Ce3+ during sol-gel process.

详情信息展示

Mid-Temperature Synthesis of CeO2-TiO2 Complex Compound and Its XRD Structure Study

陈林深1,吕光烈1,胡秀荣1

(1.Center of Measurement and Analysis, Zhejiang University, Hangzhou 310028, China)

Abstract:The CeTi2O6, which is formed above 1300 ℃ by ceramic method, was obtained at 700 ℃ using sol-gel synthesis method. XRD analysis shows that there is 8% deficient of Ce in the structure. The chemical formula is Ce0.92Ti2O5.84, which has a monoclinic structure with space group of C 2/m. Its cell parameters are a=0.9811(8) nm, b=0.3726(3) nm, c=0.6831(6) nm, and β=118.84°. After being treated at 1300 ℃ for 3 h, the system keeps stable but the deficient disappears, while the chemical formula change to the normal CeTi2O6, and the cell parameters are a=0.9813(3) nm, b=0.3752(4) nm, c=0.6883(5) nm, β=119.05°. The key to synthesis the precursors of CeTi2O6 is that Ti4+ and Ce3+ ions must reach the atomistic distributing state and prevent the oxidation of Ce3+ during sol-gel process.

Key words:Semiconductor materials; sol-gel process; CeO2-TiO2 complex compound; XRD Rietveld analysis; rare earths;

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