电容铝箔微观结构的TEM和X射线衍射研究
来源期刊：中南大学学报(自然科学版)1987年第1期
论文作者：张纬斌 刘武
文章页码：39 - 44
关键词：电解电容器； 铝； 金属箔； 透射电子显微术； 形态分析； 显微结构； X射线衍射强度； 形变热处理
Key words：electrolytic capacitors； aluminum； metal foils； transmission electron microscopy(TEM)； morphological analysis； microstructure； intensity of X-ray diffraction
摘 要：本文采用不同形变热处理高纯铝箔,经电解抛光和减薄后,用高压透射电镜观测了蚀坑形貌与其它微观结构,同时根据 X 射线晶面衍射强度分析,建立了铝箔易见蚀坑形貌与高 Fhkl值的实质联系,为制取高比电容铝箔,提供了理论依据.
Abstract: In this article,high purity aluminum foils after different thermo-mechanical treatment were used as samples.The samples underwent electrolytic polishing and thining and the etching pit morphology and other microstructures were observed with H-800EM.The crystalline orientations were measured with X-ray analysis.An essential relation of the easily visible etching pit morphology to the high Fhkl value was found.On its theoretical basis some principles were proposed for making capacitor aluminum foil.
