Atomic diffusion properties in wire bonding

来源期刊:中国有色金属学报(英文版)2006年第2期

论文作者:李军辉 王福亮 韩雷 段吉安 钟掘

文章页码:463 - 466

Key words:thermosonic bond; atomic diffusion; dimples, bonding strength

Abstract: The lift-off characteristics at the interface of thermosonic bond were observed by using scanning electron microscope (JSM-6360LV). The vertical section of bonding point was produced by punching, grinding and ion-sputter thinning, and was tested by using transmission electron microscope (F30). The results show that the atomic diffusion at the bonded interface appears. The thickness of Au/Al interface characterized by atomic diffusion is about 500 nm under ultrasonic and thermal energy. The fracture morphology of lift-off interface is dimples. The tensile fracture appears by pull-test not in bonded interface but in basis material, and the bonded strength at interface is enhanced by diffused atom from the other side.

基金信息:the National Natural Science Foundation of China
the National Basic Research Program of China

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