基于同步辐射连续X射线谱的多重孪生形态与长大的原位分析

来源期刊:中国有色金属学报(英文版)2015年第7期

论文作者:李 理1$ 2

文章页码:2156 - 2164

关键词:同步辐射X射线;形变孪生;原位分析;局域取向差;几何必需位错

Key words:synchrotron polychromatic X-ray; deformation twinning; in situ analysis; local misorientation; geometrically necessary dislocations

摘    要:同步辐射连续X射线谱微衍射技术被应用于原位研究AZ31 (Mg-3Al-1Zn)薄板单向拉伸过程中的形变孪生,对孪晶在64~73 MPa载荷条件下的形态和生长进行原位分析。在先进光源中心(ALS)的12.3.2光束线采集的X射线衍射数据被用来表征面积为396 μm × 200 μm的关注区域。该实验装置和具有深度分辨能力的X射线显微术可在亚微米尺度上确定晶粒内位置与取向联系。一系列基体晶粒按照晶体取向分类来研究孪生行为。结果展示了相同晶粒内多重孪生的孪生变体选择、局域取向差波动及镶嵌块扩展。随着载荷增加,沿孪晶迹线方向的取向差波动持续增加,其原因归结为几何必需位错的积累。

Abstract: Synchrotron polychromatic X-ray microdiffraction (micro-XRD) was applied to study in situ deformation twinning of commercially AZ31 (Mg-3Al-1Zn) strip subjected to uniaxial tension. The morphology and growth of twins were analyzed in situ under the load level from 64 to 73 MPa. The X-ray microdiffraction data, collected on beamline 12.3.2 at the Advanced Light Source, were then used to map an area of 396 μm × 200 μm within the region of interest. The experimental set-up and X-ray diffraction microscopy with a depth resolution allow the position and orientation of each illuminated grain to be determined at the submicron size. A list of parent grains sorted by crystallographic orientation were selected to examine their twinning behavior. The results depict twin variant selection, local misorientation fluctuation and mosaic spread for multi-twins within the same parent grain. As load increases, the amplitude of misorientation fluctuation along twin trace keeps increasing. This is attributable to the accumulation of geometrically necessary dislocations.

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