Abstract: The composition and structure of LY12 alloy imp lanted with N, then with Ti, finally with N and Ti by plasma based ion implantation (PBII) was characterized using X-ray photoelectron spectroscopy (XPS) and glancing X-ray diffractometry(GXRD). The chemical state of elements at various depth in the modified layer w as analyzed using Gaussian-Lorentzion fitting criterion. The depth profiles show that the modified layer can be divided into four parts: the surface layer with higher content of N and Ti, the subsurface one with higher content of Ti and lower content of N, the transition one containing Ti, Al, O and N , and the N-implanted one. GXRD shows that the modified layer consists of TiN, TiO2 , α-Ti, TiAl3, Al2O3 and AlN. The fitting results indicate that the surface layer contains most TiN and some TiO2, the subsurface one holds most α-Ti and much TiN, the transition one covers TiO2, TiN, TiAl3, Al2O3 and AlN, and the N-implanted one includes AlN, Al2O3 and α(Al). There are al so some N-solid solution and O-solid solution in the modified layer. The fitting results still show that the distribution of each element in the corresponding phase is similar to that of XPS depth profiles.
XPS study of modified layer of aluminum alloy implanted with nitrogen and titanium by plasma based ion implantation
Abstract:
The composition and structure of LY12 alloy implanted with N, then with Ti, finally with N and Ti by plasma based ion implantation (PBII) was characterized using X ray photoelectron spectroscopy (XPS) and glancing X ray diffractometry (GXRD) . The chemical state of elements at various depth in the modified layer was analyzed using Gaussian Lorentzion fitting criterion. The depth profiles show that the modified layer can be pided into four parts: the surface layer with higher content of N and Ti, the subsurface one with higher content of Ti and lower content of N, the transition one containing Ti, Al, O and N, and the N implanted one. GXRD shows that the modified layer consists of TiN, TiO 2, α Ti, TiAl 3, Al 2O 3 and AlN. The fitting results indicate that the surface layer contains most TiN and some TiO 2, the subsurface one holds most α Ti and much TiN, the transition one covers TiO 2, TiN, TiAl 3, Al 2O 3 and AlN, and the N implanted one includes AlN, Al 2O 3 and α (Al) . There are also some N solid solution and O solid solution in the modified layer. The fitting results still show that the distribution of each element in the corresponding phase is similar to that of XPS depth profiles.