多相场法研究层片厚度对三维共晶层片生长的影响

来源期刊：上海金属2010年第4期

论文作者：杨玉娟 严彪

文章页码：16 - 19

关键词：数值模拟； 多相场； 共晶层片； 层片厚度

Key words：Numerical Simulation； Multi-Phase Field； Lamellar Eutectic； Lamellar Thickness

摘    要：利用KKSO多相场模型,研究CBr4-C2Cl6过共晶合金,当层片间距为4.1μm时,层片厚度对三维共晶层片生长过程的影响。研究表明层片厚度对三维共晶层片生长影响显著,厚度效应有可能导致层片取向的垂直偏转和倾斜偏转。层片厚度比较小时,共晶层片以类似于二维的1λ振荡形式生长;当层片厚度大于6.4μm以后,层片开始偏转,并最终在横截面上垂直于初始层片方向;层片厚度在8.6～14.2μm之间取值时,在横截面内层片发生倾斜;之后,出现Z字形分叉,进一步增加层片厚度值至18.2μm时,共晶层片又发生垂直偏转。

Abstract: With the KKSO multi-phase field model,the effect of lamellar thickness during three dimensional lamellar eutectic growth was studied when the lamellar spacing was fixed with 4.1 μm. it was showed that the effect of lamellar thickness during the lamellar eutectic growth was significant,the lamellar thickness effect might lead to vertical rotation or oblique rotation of the lamellar orientation. The lamellar grew in a 1 λ mode as similarly as it did in 2-dimension when the lamellar thickness was small. When the lamellar distorted vertically the lamellar direction was perpendicular to the initial one in the transverse section when the lamellar thickness was bigger than 6.4 μm. The lamellar distorted tilting in the transverse section when the lamellar thickness changed within the range of 8.6~14.2 μm. The most important point was that a zigzag instability occurred in the transverse section with the increasing of lamellar thickness. The further increasing of lamellar thickness would lead to lamellar distorting vertically again.