Magnetization and coercivity in Co/Pt multilayers withconstant total Co layer thickness
来源期刊:中国有色金属学报(英文版)2010年第5期
论文作者:聂颖 杨鑫 张鹏 桑海
文章页码:819 - 824
Key words:Co/Pt multilayers; perpendicular magnetic anisotropy; coercivity
Abstract: Co/Pt multilayers with perpendicular anisotropy were deposited using a dc magnetron sputtering system under high vacuum. Magnetization process was investigated by the measurement of magnetic components parallel and perpendicular to the applied field. A dependence of the coercivity of Co/Pt multilayers on the Co layer thickness was reported, in which the total thickness of Co layers kept constant. It is observed that the coercivity increases with the increment of Co layer thickness. For the samples with the same Co layer thickness while different total Co layer thickness, the coercivity first increases and then decreases with the increase of the total thickness of Co layers. This effect could be attributed to the competition between the reduction of HC related to incoherent reversal and the step-up of HC contributed by the magnetic polarization of Pt atoms at the interface of Co and Pt layers during magnetization reversal. The results show that the change of the coercivity is strongly related to the Co layer thickness, but not the total thickness of Co layers. The dependence of the coercivity on the angle between an applied field and the easy axis shows that the nucleation mode is dominant in magnetization reversal process of the samples.
基金信息:supported by the National Natural Science Foundation of China
supported by the National Basic Research Program of China
NIE Ying(聂 颖)1, 2 , YANG Xin(杨 鑫)2 , ZHANG Pang(张 鹏)1, SANG Hai(桑 海)1
1. National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University,
Nanjing 210093, China;
2. College of Science, Liaoning Technical University, Fuxin 123000, China
Received 3 June 2009; accepted 30 September 2009
Abstract: Co/Pt multilayers with perpendicular anisotropy were deposited using a dc magnetron sputtering system under high vacuum. Magnetization process was investigated by the measurement of magnetic components parallel and perpendicular to the applied field. A dependence of the coercivity of Co/Pt multilayers on the Co layer thickness was reported, in which the total thickness of Co layers kept constant. It is observed that the coercivity increases with the increment of Co layer thickness. For the samples with the same Co layer thickness while different total Co layer thickness, the coercivity first increases and then decreases with the increase of the total thickness of Co layers. This effect could be attributed to the competition between the reduction of HC related to incoherent reversal and the step-up of HC contributed by the magnetic polarization of Pt atoms at the interface of Co and Pt layers during magnetization reversal. The results show that the change of the coercivity is strongly related to the Co layer thickness, but not the total thickness of Co layers. The dependence of the coercivity on the angle between an applied field and the easy axis shows that the nucleation mode is dominant in magnetization reversal process of the samples.
Key words: Co/Pt multilayers; perpendicular magnetic anisotropy; coercivity
1 Introduction
The magnetization and coercivity are important topics in magnetic material research. The development of the magnetic information storage technique continually refreshes the record density of data. Higher density can be achieved by means of perpendicular recording due to the lower superparamagnetic limit and larger anisotropy in magnetic media with perpendicular magnetic anisotropy (PMA). So, the research on the material with PMA is always highly regarded. As well known, Co/Pt is a representative sample of PMA system, which has attracted much attention in the last twenty years for both fundamental researches and magnetic information storage applications[1-5]. PMA can be phenomenologically described as an interfacial magetocystalline anisotropy due to the symmetry breaking at the interfaces. It is known that the anisotropy of the orbital magnetic moment at the interface between ferromagnetic and non-magnetic layers contributes to the perpendicular magnetic anisotropy due to the spin-orbit interaction. The interesting behavior in Co/Pt multilayer is always a hot topic because of its PMA[6-8]. As well known, the PMA of the Co/Pt multilayers originates from the dominating interfacial anisotropy when the ferromagnetic (FM) layer is very thin[9]. The individual ultra-thin Co layers are coupled together, further, by Pt spacers and behave as a single ferromagnet.
The coercivity, HC, plays an important role in the recording process. There are many reports on the dependence of HC on both depositing gas pressure of Co/Pt multilayer[10-11] and temperature[12]. Also, KNEPPER and YANG[13] thought that the Co/Pt multilayer with PMA exhibits Ruderman-Kittel-Kasuya- Yosida (RKKY) oscillatory interlayer coupling as the thickness of the Pt spacer increases, leading to the oscillation of HC when the thickness of the Pt spacer is changed.
In fact, HC is very sensitive to the Co layer thickness and less dependent on the Pt layer thickness. Most studies focused either on changing Pt layer thickness[13] or the total thickness of Co/Pt multilayer[14], but less investigation on changing the Co layer thickness with constant total thickness of Co layers in Co/Pt multilayer. In this work, we report a study of coercivity when total thickness of Co layers in Co/Pt multilayer is constant. We divided the samples into five groups, and every group is composed of the samples with the same total thickness of Co layers and different Co layer thickness. The total thickness of Co layers is not same for different groups. In this case, the dependence of HC on the Co layer thickness and the total thickness of the Co layers can be compared. It would be beneficial to exploring the mechanism of coercivity in Co/Pt multilayers with PMA. Magnetization process was investigated by the measurement of magnetic components parallel and perpendicular to the applied field direction.
2 Experimental
All samples of Co/Pt multilayer were deposited onto a 10 nm Pt buffer layer on the Si(100) wafer at room temperature (RT) using a dc magnetron sputtering system under high vacuum. The base pressure of the sputtering system was around 1.0×10-5 Pa, and the Ar pressure during sputtering was about 0.3 Pa. The Co/Pt multilayer sample was prepared with the layer structure [Co(tx nm)/Pt(1.25 nm)]n/Co(ty nm)/Pt(tPt nm) to keep the total thickness of the Co layers, tCo (tCo=ntx+ty), constant. Five series of samples were prepared with various total thicknesses of Co layers, tCo=1.26, 1.8, 2.16, 2.7, and 3.42 nm, labeled as Ⅰ, Ⅱ, Ⅲ, Ⅳ and Ⅴ, respectively. In each series, tx, Co layer thickness in the Co/Pt multilayers, was changed as 0.27, 0.36, 0.45, 0.54, and 0.63 nm, labeled as 1, 2, 3, 4, and 5, respectively. Therefore, the samples were labeled as Sample PQ, in which P denoted Ⅰ, Ⅱ, Ⅲ, Ⅳ, or Ⅴ, and Q denoted 1, 2, 3, 4, or 5, respectively. For the expression of the sample, it should be noted that tPt=0.75 nm when ty is zero, otherwise tPt=2 nm, in order to keep that the thickness of the Pt spacer between two adjacent Co layers is 1.25 nm and the thickness of top Pt layer is 2 nm, respectively, in each sample.
Magnetic measurements were performed in a vibrating sample magnetometer with vector pickup coils. As shown in Fig.1, the direction of the applied field H is denoted as the x axis, and easy axis is along the normal direction of the sample plane. The angle θ between the H direction and the normal direction of the sample plane can be changed by rotating the sample. The hysteresis loops of the sample were measured at room temperature from the saturated states in a positive field, and the magnetization components parallel (Mx) and perpendicular (My) to the applied field direction were recorded.
Fig.1 Scheme showing direction of applied field H defined as x axis and easy axis (solid line with arrow) along normal direction of film plane (θ: angle between direction of positive applied field and easy axis)
3 Results and discussion
Fig.2 shows the small angle XRD patterns of [Pt(40 ?)/Co(2.7 ?)]10Pt(40 ?) and [Pt(30 ?)/Co(6.3 ?)]10 Pt(30 ?). It is shown that a periodic structure appears for Co/Pt multilayers prepared by magnetron sputtering. Here, the Co layer thicknesses shown in Figs.2(a) and (b) are the minimum and the maximum in the periodic structure of all 25 samples mentioned above, respectively. But, the Pt layer thickness is larger than that in 25 samples. Because the minimum thickness of Pt layer is 12.5 ? in 25 samples, it is still large enough so that Pt layer exhibits the layered structure. Only the state of Co layer is detected by XRD. So, the Pt layer thickness is decided by XRD measurement precision rather than the Pt layer thickness in 25 samples. The XRD pattern confirms the layered structure of Co layer sputtered. It is obvious that the sample bears good artificial structure. The film thickness of multilayers calculated by XRD pattern corresponds well with the result calculated by sputtering rate.
Fig.3 shows the hysteresis loops of Mx measured at θ=0? for the sample Ⅰ1, Ⅰ2, Ⅰ3, Ⅰ4, Ⅰ5, in which tCo is 1.26 nm, with good squareness. And My loop is near flat along the horizontal axis. My loop is not shown here for reasons of clarity. When θ=0, Mx is the magnetization, M, of the sample. It is obvious that PMA has been established in the five samples. One can see that HC changes a lot even if tCo of each sample is the same. The inset shows the dependence of coercivity HC on the Co layer thickness, tx, for samples of tCo=1.26 nm. The minimum HC is 27/(4π) kA/m in the sampleⅠ1, where tx=0.27 nm. The maximum HC is 256/(4π) kA/m in the sample Ⅰ5, where tx=0.63 nm. This indicates that the thicker the Co layer is, the larger the HC for the Co/Pt multilayer with PMA.
The dependence of the coercivity on tCo for all the
Fig.2 Small angle XRD patterns of [Pt(40 ?)/Co(2.7 ?)]10 Pt(40 ?) (a) and [Pt(30 ?)/Co(6.3 ?)]10Pt(30 ?) (b)
Fig.3 Hysteresis loops of sample with tCo=1.26 nm (Inset: dependence of HC on Co layer thickness, tx, for samples with tCo=1.26 nm)
25 samples is shown in Fig. 4. Each curve corresponds to the same tx, but different tCo. Firstly, the HC is enhanced with the increase of tx when they are of the same tCo. Secondly, the HC is various for the samples with the same tx but different tCo, which indicates an influence of tCo on the HC. One could find that the influence of tCo on HC when tx is the same is weaker than that of tx when tCo is the same, indicating that the HC of the Co/Pt multilayers is dominated by the thickness of the Co layer, tx. Meanwhile, the behavior of HC is similar for the four series samples except Q=5, as shown in Fig.4. The HC first increases and then decreases with the increase of tCo for the same tx, in which the increase of tCo means that the number of repetitions (n) increases, i.e. both Pt layer number and Co layer number increase. As well known, the Pt atoms in the vicinity of a FM layer could be polarized and contribute a little bit of magnetic moments[13, 15-16]. And the magnetic polarization of Pt atoms could extend into the Pt layer at room temperature[13, 17]. Thus, the polarized Pt layers could not only act as an effective FM layers, but also enhance the coupling of the adjacent Co layers. When n increases, the number of magnetically polarized Pt atoms in the vicinity of Co layer increases, and then the coupling of Co layers becomes stronger, leading to the increase of the HC. With the further increase of tCo, the HC no longer increases, whereas decreases with the increase of tCo, which could be attributed to the existence of incoherent reversal during magnetization reversal.
Fig.4 Dependence of coercivity on tCo for samples with different tx
Fig.5 shows the hysteresis loops of the samples Ⅰ1, Ⅳ1 and Ⅴ1 measured at θ=0?, in which tx of the samples is 0.27 nm with tCo of 1.26, 2.7 and 3.42 nm, respectively. It is noted that the coercivity for these three samples displays little difference, which is consistent with the discussion above that the coercivity of the Co/Pt multilayers is dominated by tx, not tCo. In this case, Co layer number, n, varies with different tCo, and thus, it is easy to understand that the effect of n on the coercivity of the Co/Pt multilayers is weak. However, the shape of the corresponding hysteresis loops (shown in Fig.5) is distinct from each other as tCo and n increase. The squareness of hysteresis loops of the sample Ⅳ1 and Ⅴ1 is less than that of the sample Ⅰ1. In fact, magnetization reversal for sample Ⅰ1 is coherent due to
Fig.5 Hysteresis loops of samples Ⅰ1, Ⅳ1, and Ⅴ1
the FM coupling of Co layers through the Pt spacer. But, magnetization reversal for samples Ⅳ1 and Ⅴ1 is fully different from that of Ⅰ1. For samples Ⅳ1 and Ⅴ1, the magnetization switching takes place when the applied field H>0 during magnetization reversal from positive to negative field applied, displaying the typical incoherent reversal which means that magnetic moments of each Co layer is not reversed synchronously. The switching behavior is determined by the competition of magnetostatic energy and domain-wall energy in an applied magnetic field. According to Ref.[18], it is favorable to form a single domain state for the multilayers with small n and multiple domain state for multilayers with large n at remanence. For samples with the same tx, when tCo increases, that is, n is large, magnetization reversal is incoherent due to the formation of multiple domain. During incoherent reversal, the magnetic moment direction of each domain is different. The magnetic moment of different domains partly countervails each other so that net magnetic moment is easy to be zero in a low applied field, i.e. low coercivity. In other words, the HC falls down with the increase of tCo due to incoherent reversal. As it is mentioned above, the HC goes up with the increase of tCo by the magnetic polarization of Pt atoms at the interface between Co and Pt in the multilayer during magnetization reversal. Thus, when tCo increases, the tendency of the HC of the multilayers with the same tx is determined by competition of the two effects. When tCo is small, the effect of the magnetic polarization of Pt atoms is dominant, so the HC goes up with the increase of tCo. As tCo becomes large, the effect of incoherent reversal is more obvious, leading to the decrease of HC as further increasing the tCo, as seen in the later part of the curves in Fig.4.
It is noted that HC first increases and then decreases, with tCo except the series Q=5, as shown in Fig.4. However, the critical tCo, at which HC reaches its peak on a curve, is different for various tx. The critical tCo is 1.8 nm for the samples with tx=0.27, 0.36, and 0.45 nm, and 2.16 nm for the samples with tx=0.54 nm, respectively. It is interesting that the n falls in the range of 4-5 for these tx values. The results show that HC decreases with increase of tCo when n>5, indicating that the reduction of HC caused by incoherent reversal overpasses the step-up of HC contributed by the magnetic polarization of Pt atoms in the procedure of magnetization reversal. For the samples of tx=0.63 nm, the tendency of HC with tCo (shown in Fig.4) is different from that of samples with other tx values because of the effect of the top Co layer, ty. When tx=0.63 nm, ty is 0, 0.54, 0.27, 0.18 and 0.27 nm for different tCo values, respectively. According to the discussion above, the HC increases with the increase of the Co layer thickness. Because ty is always smaller than tx, the role of the top Co layer does not favor HC. Although the effect of the top Co layer on HC is usually weak, the effect of the top Co layer could not be ignored for small n. For sample Ⅰ5, in which tx is 0.63 nm with tCo of 1.26 nm, n=2 and ty=0, the HC is dominated only by the Co layer, tx, without the effect of the top Co layer. Therefore, its HC gets the maximum. As tCo of the sample with tx of 0.63 nm increases, ty of the top Co layer is larger than 0, and HC becomes small.
Fig.6 shows the hysteresis loops of the sample Ⅲ5 measured at θ=45?. One can see from Fig.6 that with decreasing the applied field from a positive maximum value (descending branch), My increases to the positive, and falls to the negative, then approaches to zero for large negative field. With increasing the applied field from a negative maximum value (ascending branch), My decreases to the negative, and then raises to the positive, finally approaches to zero for large positive field. While Mx increases to the positive maximum value when the applied field is at maximum positive value, and Mx decreases to the negative maximum value when the applied field is at the maximum negative value. So, we can deduce the pathway of the magnetization rotation. For the descending branch, the magnetization first rotates counterclockwise toward one direction of the easy axis from the direction of positive applied field. Next, irreversible reversal process takes place when the applied field reaches the critical field. Finally, the magnetization rotates clockwise to the direction of negative field applied. For the ascending branch, the magnetization first rotates counterclockwise toward another direction of the easy axis from the direction of negative field applied, and after the irreversible reversal process, the magnetization rotates clockwise to the direction of positive field applied. The angle between the magnetization and x axis varies nearly 180? during the irreversible reversal process. We measure hysteresis loops of all samples in different angles. Other hysteresis loops are not shown here. The pathway of the magnetization mentioned above is similar for all samples.
Fig.6 Hysteresis loops of sample Ⅲ5 measured at θ=45?: (a) Whole hysteresis loops; (b) Low field part
Fig.7 shows the behavior of the angular dependence of the coercivity, HC, for the sample Ⅲ5. The angle θ between the applied magnetic field and the normal direction of the sample plane (easy axis) can be changed by rotating the sample during magnetic measurement. HC increases as the θ increases from 0 to about 75? and then decreases sharply with further increment of θ. The maximal HC is located at around 75?. It is inferred that the magnetization reversal of this sample seems to be dominated by magnetic domain wall motion from the behavior of HC on angle θ[19]. But, the deviation between HC(θ) and HC(0)/cosθ increases with the increase of angle θ, where HC(θ) and HC(0) correspond to angle of θ and 0?, respectively. This indicates that angular dependence of HC does not obey Kondorsky relation[20], which suggests that the nucleation mode is dominant in magnetization reversal process of the samples. It is consistent with the result mentioned above that the angle between the magnetization and x axis varies nearly 180? during the irreversible reversal process. The mechanism of coercivity is of nucleation type. The same results are obtained in all samples. In other words, the mechanism of coercivity is irrelevant with Co layer thickness and the total thickness of Co layer in all samples.
Fig.7 Angular dependence of HC for sample Ⅲ5
4 Conclusions
1) The coercivity of Co/Pt multilayers increases with the increase of Co layer thickness, tx, when the total thickness of Co, tCo, keeps constant.
2) When the Co layer thickness, tx, is the same, the coercivity first increases and then decreases with the increment of the total thickness of Co layer, tCo. This could be attributed to the competition between the reduction of HC related to incoherent reversal and the step-up of HC contributed by the magnetic polarization of Pt atoms at the interface between Co and Pt layers during magnetization reversal.
3) The effect of the total thickness of Co layer, tCo, is weaker than that of the Co layer thickness, tx, on coercivity in the Co/Pt multilayers.
4) The angle between the magnetization and x axis varies nearly 180? during the irreversible reversal process. The nucleation mode is dominant in magnetization reversal process of the samples.
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(Edited by YANG Bing)
Foundation item: Projects(10574065, 20833002) supported by the National Natural Science Foundation of China; Project(2009CB929503) supported by the National Basic Research Program of China
Corresponding author: SANG Hai; Tel: +86-25-83592911; E-mail: haisang@nju.edu.cn
DOI: 10.1016/S1003-6326(09)60220-X