Role of Substrate Roughness in ZnO Nanowire Arrays Growth by Hydrothermal Approach
来源期刊：Acta Metallurgica Sinica2016年第3期
论文作者：Qiu-Hong Wang Chao-Long Tang Cheng-Ming Jiang Dan-Feng Du Feng Wang Jin-Hui Song
文章页码：237 - 242
摘 要：The role of substrate roughness in ZnO nanowire（NW） arrays hydrothermal growth has been systematically studied.Six silicon substrates with different roughness by chemical etching have been selected to grow ZnO NW arrays hydrothermally after sputtering 5-nm-thick ZnO seed layer as catalyst.The as-grown samples reveal that average diameters and number densities of ZnO NW arrays are inversely proportional to the increasing substrate roughness observed by atomic-force microscopy and scanning electron microscopy.Furthermore,the theoretically derived equations based on nucleation with the Gibbs free energy to describe relations of substrate roughness versus average NW diameter and NW number density match well with experimental results.Research results in this paper can be used to control the number density and the average diameter of ZnO NW arrays by alternating substrate roughness.
Qiu-Hong Wang1,2，Chao-Long Tang1，Cheng-Ming Jiang1，Dan-Feng Du1，Feng Wang1,2，Jin-Hui Song1
1. Department of Metallurgical and Materials Engineering,Center for Materials for Information Technology(MINT),University of Alabama2. Department of Mechanical Engineering,Changzhou Institute of Mechatronic Technology
摘 要：The role of substrate roughness in ZnO nanowire（NW） arrays hydrothermal growth has been systematically studied.Six silicon substrates with different roughness by chemical etching have been selected to grow ZnO NW arrays hydrothermally after sputtering 5-nm-thick ZnO seed layer as catalyst.The as-grown samples reveal that average diameters and number densities of ZnO NW arrays are inversely proportional to the increasing substrate roughness observed by atomic-force microscopy and scanning electron microscopy.Furthermore,the theoretically derived equations based on nucleation with the Gibbs free energy to describe relations of substrate roughness versus average NW diameter and NW number density match well with experimental results.Research results in this paper can be used to control the number density and the average diameter of ZnO NW arrays by alternating substrate roughness.
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