ICP-AES测定高纯钨中杂质元素

来源期刊：中南大学学报(自然科学版)1999年第1期

论文作者：范健 黄进宇 邹玫玫 裘立奋 王吉申 杜方才

文章页码：71 - 73

关键词：微量元素;钨;基体效应;光谱干扰;沉淀分离;干扰系数校正;电感耦合等离子体原子发射光谱

Key words：trace element; tungsten; matrix effect; spectral interference; precipitation seperation; interference factor correction; ICP-AES

摘    要：采用电感耦合等离子体原子发射光谱法 (即ICP-AES法)测定钨中的14种杂质元素,并对19种微量元素的基体效应和光谱干扰进行了研究,建立了ICP-AES与基体分离及干扰系数校正相结合的方法.此法解决了钨在分析测定时的基体干扰问题,能快速、准确、同时测定高纯钨中14种微量元素,回收率高于 90%,相对标准偏差为1%～6%.它为钨产品的检测提供了新的切实可行的分析手段.

Abstract: The matrix eftect and spectral interference of tungsten on the determination of 19 trace elements were studied, and a method, ICP-AES combined with the matrix seperation and factor correction, was established. This method solved the problem of the matrix interference in the analysis of tungsten, and the accurate determination of 14 trace elements in higher pure tungsten rapidly at the same time came true. The recoveries were above 90%. The relative standard deviations were 1%～6%. This method provides a new and feasible way for the analysis of the production of tungsten.