简介概要

Growth and Characterization of GaInP Layers on GaAs Substrates by MOCVD

来源期刊:Rare Metals1993年第4期

论文作者:余庆选 彭瑞伍 励翠云 任尧成

文章页码:264 - 266

摘    要:<正> The ternary semiconductor Ga0.5In0.5Pmay be used in optoelectronics andmicrowave devices to overcome the problemssuch as the formations of DX centers andoxidation of Al that occurred frequently inAIGaAs.It can also be used as active regionsin GalnP/AlGalnP visible double

详情信息展示

Growth and Characterization of GaInP Layers on GaAs Substrates by MOCVD

摘要:<正> The ternary semiconductor Ga0.5In0.5Pmay be used in optoelectronics andmicrowave devices to overcome the problemssuch as the formations of DX centers andoxidation of Al that occurred frequently inAIGaAs.It can also be used as active regionsin GalnP/AlGalnP visible double

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